Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability
Shi-Shun Chen, Xiaoyang Li, Wenrui Xie
Topics & Concepts
Reliability (semiconductor)Unit (ring theory)Degradation (telecommunications)Reliability engineeringProcess (computing)Computer scienceStatisticsEngineeringMathematicsTelecommunicationsMathematics educationPower (physics)Operating systemPhysicsQuantum mechanicsReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design