Litcius/Paper detail

Engineering and Analytical Method for Estimating the Parametric Reliability of Products by a Low Number of Tests

Alexey Amosov, V. A. Golikov, Mikhail V. Kapitonov, Fedor Vasilyev, Oleg K. Rozhdestvensky

2022Inventions20 citationsDOIOpen Access PDF

Abstract

The paper provides an overview of methods for determining reliability indicators and, on the basis of the analysis, proposes a new method for assessing the parametric reliability of products based on a small number of tests. The determination of the parameters and double logistic distribution based on the test results is considered, a statistical experiment was carried out, which was based on the method of statistical modeling of Monte Carlo. An example of evaluating parametric reliability by a new method is also given, on the basis of which an engineering technique is proposed. In the conclusion, remarks are made regarding the advantages of the novel method.

Topics & Concepts

Reliability (semiconductor)Parametric statisticsReliability engineeringMonte Carlo methodComputer scienceBasis (linear algebra)StatisticsEngineeringMathematicsPhysicsPower (physics)GeometryQuantum mechanicsEngineering Diagnostics and ReliabilityAerospace, Electronics, Mathematical Modeling