Using ToF-SIMS to study metal ions transfer between chalcopyrite and galena during grinding
Hao Lai, Quanjun Liu, Jiushuai Deng, Shuming Wen
Topics & Concepts
GalenaChalcopyriteDissolutionGrindingCopperSecondary ion mass spectrometryAdsorptionChemistryMetallurgyMaterials scienceAnalytical Chemistry (journal)Mass spectrometryPyriteSphaleriteEnvironmental chemistryPhysical chemistryChromatographyMetal Extraction and BioleachingMinerals Flotation and Separation TechniquesMineral Processing and Grinding