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Triangular Single Shockley Stacking Fault Analyses on 4H-SiC PiN Diode with Forward Voltage Degradation

Johji Nishio, Aoi Okada, Chiharu Ota, Mitsuhiro Kushibe

2020Journal of Electronic Materials19 citationsDOI

Topics & Concepts

Scanning transmission electron microscopyMaterials scienceBurgers vectorStacking faultStackingPartial dislocationsZigzagDiodeTransmission electron microscopyDislocationDark field microscopyMolecular physicsCrystallographyOpticsOptoelectronicsMicroscopyChemistryNuclear magnetic resonanceGeometryPhysicsNanotechnologyMathematicsComposite materialSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis
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