VLSI test through an improved LDA classification algorithm for test cost reduction
Liang Huang, Tai Song
Topics & Concepts
AlgorithmReduction (mathematics)Test (biology)Test compressionVery-large-scale integrationAutomatic test pattern generationIntegrated circuitComputer scienceFunction (biology)Linear discriminant analysisMathematicsMachine learningArtificial intelligenceEngineeringElectronic circuitEmbedded systemGeometryPaleontologyElectrical engineeringOperating systemEvolutionary biologyBiologyVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test Systems