Development of a deep learning-based method to identify “good” regions of a cryo-electron microscopy grid
Yuichi Yokoyama, Tohru Terada, Kentaro Shimizu, Kouki Nishikawa, Daisuke Kozai, Atsuhiro Shimada, Akira Mizoguchi, Yoshinori Fujiyoshi, Kazutoshi Tani
Topics & Concepts
DetectorCryo-electron microscopyMagnificationClassifier (UML)Artificial intelligenceElectron microscopeMaterials scienceOpticsCytochrome c oxidaseEnvironmental scanning electron microscopeMicroscopyComputer scienceChemistryPhysicsNuclear magnetic resonanceEnzymeAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesRNA and protein synthesis mechanisms