Modeling of paths and energy losses of high-energy ions in single-layered and multilayered materials
Д.И. Тишкевич, С. С. Грабчиков, E A Grabchikova, D.S. Vasin, S B Lastovskiy, A S Yakushevich, Д.А. Винник, T.I. Zubar, I. V. Kalagin, Semen Mitrofanov, Dzmitry Yakimchuk, А.В. Труханов
Abstract
Abstract Modern electronic systems and equipment used in aerospace and nuclear technology, as well as many scientific and medical devices, are used under the influence of a wide range of ionizing radiation (electrons, protons, heavy charged particles etc.). Protons or heavy charged particles exposure can lead to failures in the operation of spacecrafts electronic devices, which is associated with the radiation effects occurrence in an integrated circuits. One of the most effective ways to solve this problem is protection by radiation shields. Linear and mass paths of protons and Ar + ions in Al, Al 2 O 3 , Bi, and W 77, 7 Cu 22, 3 composite shields were calculated using a SRIM software package. It is shown that the protection efficiency against high-energy ions by materials with large atomic charge values ( Z ) is higher from the position of linear ranges of particles, and lower from the position of mass ranges than materials with low Z values. The dependence of the threshold energy on the serial number of particles for Al, Bi and W 77, 7 Cu 22, 3 composite shields is determined. The effect of the sequence in the arrangement and layer thicknesses in the Bi/Al/Al 2 O 3 multilayered structures on the protection efficiency against high-energy ions was studied.