A simulation-based analysis of effect of interface trap charges on dc and analog/HF performances of dielectric pocket SOI-Tunnel FET
Chandan Kumar Pandey, Avtar Singh, Saurabh Chaudhury
Topics & Concepts
Ambipolar diffusionSilicon on insulatorDielectricMaterials scienceOptoelectronicsAcceptorCapacitanceReliability (semiconductor)Trap (plumbing)Electrical engineeringChemistrySiliconPower (physics)PhysicsElectronEngineeringCondensed matter physicsElectrodePhysical chemistryMeteorologyQuantum mechanicsAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesFerroelectric and Negative Capacitance Devices