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A Novel Asymmetric Trench SiC MOSFET With an Integrated JFET for Improved Reverse Conduction Performance

Yiren Yu, Tao Liu, Rongyao Ma, Zijun Cheng, Jingyu Tao, Jingwei Guo, Hao Wu, Shengdong Hu

2023IEEE Transactions on Electron Devices13 citationsDOI

Abstract

In this article, a 1200-V asymmetric trench (AT) silicon carbide (SiC) metal–oxide–semiconductor field effect transistor (MOSFET) with an integrated junction field effect transistor (JFET) is proposed with improved cut-in voltage ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {cut-in}}$ </tex-math></inline-formula> ) and switching loss. For the proposed device named IJ-ATMOS, the bottom p-well in contact with the source can deplete the surrounding current spreading layer (CSL) region, so the JFET channel (JFET-C) is normally- OFF when device is in forward operation. In addition, the source is in contact with CSL. Due to a smaller potential barrier, <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {cut-in}}$ </tex-math></inline-formula> of this path is lower than the p-n body diode. Therefore, the intrinsic body diode is fully inactivated and the bipolar degradation is eliminated. Meanwhile, the gate to drain charge ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${Q}_{\text {gd}}$ </tex-math></inline-formula> ) and switching loss are reduced by using the split gate MOSFET structure. Through TCAD simulation, the IJ-ATMOS decreases <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {cut-in}}$ </tex-math></inline-formula> by 50.35% compared to the conventional AT SiC MOSFET (C-ATMOS). The <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${Q}_{\text {gd}}$ </tex-math></inline-formula> and the switching loss are decreased by 14.29% and 30.61%, respectively.

Topics & Concepts

JFETSilicon carbideTopology (electrical circuits)DiodePhysicsMOSFETMaterials scienceOptoelectronicsField-effect transistorTransistorElectrical engineeringVoltageQuantum mechanicsEngineeringMetallurgySilicon Carbide Semiconductor TechnologiesAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devices