A Pixel-Level Segmentation Convolutional Neural Network Based on Deep Feature Fusion for Surface Defect Detection
Jingang Cao, Guotian Yang, Xiyun Yang
Abstract
Surface defect detection is very important for the quality control of product and routine maintenance of facilities, but it is still a big challenge due to the diversity and complexity of defects and environmental factors. To improve the accuracy of defect detection, we proposed a pixel-level segmentation network based on deep feature fusion for surface defect detection. The network adopts encoder-decoder structure, and it extracts low-, middle-, and high-level features via ResNet50 first. Second, by fusing adjacent feature maps at all levels and integrating the highest level feature map, multilevel feature aggregation module makes all feature maps contain context information and more details of defects. Then, multibranch decoder adopts attention modules and a multibranch structure to recover the details of defects gradually and improve the accuracy of defects segmentation. Finally, the segmentation result is produced by fusion of all branches outputs. We have evaluated the proposed network on three public data sets: MT, RSDD, and CFD. The results indicate that our proposed method outperforms the other compared methods in terms of F-measure and intersection of union (MT:73.7%, RSDD:85%, CFD:60.1%).