Litcius/Paper detail

Overview of residual stress in MEMS structures: Its origin, measurement, and control

Shankar Dutta, Akhilesh Pandey

2021Journal of Materials Science Materials in Electronics54 citationsDOI

Topics & Concepts

Microelectromechanical systemsResidual stressFabricationMaterials scienceActuatorReliability (semiconductor)ResidualCharacterization (materials science)NanotechnologyComputer scienceElectronic engineeringEngineeringComposite materialArtificial intelligenceQuantum mechanicsAlgorithmPathologyPower (physics)PhysicsMedicineAlternative medicineMetal and Thin Film MechanicsAdvanced Surface Polishing TechniquesAdvanced machining processes and optimization