Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz
Rob D. Jones, Jérôme Chéron, Bryan T. Bosworth, Benjamin F. Jamroz, Dylan F. Williams, Miguel Urteaga, A. Feldman, Peter H. Aaen
Abstract
In this paper, we investigate the effect of two calibration errors, probe placement and capacitance per unit length, on transistor characterization, from 220 GHz to 325 GHz, on both a microstrip and an inverted coplanar waveguide with a via-stitched ground plane (CPW-G) calibration kit. We find that the calibration errors tend to be greater for the microstrip calibration than for the CPW-G calibration. These findings have critical ramifications for transistor characterization and modelling, and active circuit design.
Topics & Concepts
Coplanar waveguideCalibrationMicrostripCapacitanceTransistorGround planeWaferOptoelectronicsMaterials scienceCharacterization (materials science)Electronic engineeringElectrical engineeringComputer sciencePhysicsEngineeringMicrowaveTelecommunicationsVoltageAntenna (radio)NanotechnologyQuantum mechanicsElectrodeMicrowave and Dielectric Measurement TechniquesRadio Frequency Integrated Circuit DesignMicrowave Engineering and Waveguides