ELA-YOLO: An efficient method with linear attention for steel surface defect detection during manufacturing
Ruichen Ma, Jinglong Chen, Yong Feng, Zitong Zhou, Jingsong Xie
Topics & Concepts
Materials scienceSurface (topology)Artificial intelligenceComputer scienceMathematicsGeometryIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsWelding Techniques and Residual Stresses