Material engineering to enhance reliability in 3D NAND flash memory
Ki Han Kim, Namju Kim, Yeong Kwon Kim, H. S. Kim, HakJune Oh, C. Kim, Hyeun Woo Shin, M Kim, Won Choi, Byung Chul Jang
Topics & Concepts
Flash (photography)Reliability (semiconductor)Flash memoryComputer scienceNAND gateReliability engineeringEmbedded systemEngineeringLogic gateArtVisual artsPhysicsAlgorithmQuantum mechanicsPower (physics)Semiconductor materials and devicesAdvanced Data Storage Technologies3D IC and TSV technologies