X-ray absorption spectroscopy principles and practical use in materials analysis
Wolfgang Grünert, Konstantin Klementiev
Abstract
Abstract The X-ray Absorption Fine Structure (XAFS) with its subregions X-ray Absorption Near-edge Structure (XANES) and Extended X-ray Absorption Fine Structure (EXAFS) is a powerful tool for the structural analysis of materials, which is nowadays a standard component of research strategies in many fields. This review covers a wide range of topics related to its measurement and use: the origin of the fine structure, its analytical potential, derived from the physical basis, the environment for measuring XAFS at synchrotrons, including different measurement geometries, detection modes, and sample environments, e. g. for in-situ and operando work, the principles of data reduction, analysis, and interpretation, and a perspective on new methods for structure analysis combining X-ray absorption with X-ray emission. Examples for the application of XAFS have been selected from work with heterogeneous catalysts with the intention to demonstrate the strength of the method providing structural information about highly disperse and disordered systems, to illustrate pitfalls in the interpretation of results (e. g. by neglecting the averaged character of the information obtained) and to show how its merits can be further enhanced by combination with other methods of structural analysis and/or spectroscopy.