Attention-based deep learning for chip-surface-defect detection
Shuo Wang, Hongyu Wang, Fan Yang, Fei Liu, Long Zeng
Topics & Concepts
Computer scienceArtificial intelligencePattern recognition (psychology)Deep learningFeature (linguistics)Set (abstract data type)ChipFeature extractionField (mathematics)Object detectionData miningMathematicsPhilosophyPure mathematicsProgramming languageLinguisticsTelecommunicationsIndustrial Vision Systems and Defect DetectionInfrastructure Maintenance and MonitoringAdvanced Neural Network Applications