Tomographic measurement of dielectric tensors at optical frequency
Seungwoo Shin, Jonghee Eun, Sang Seok Lee, Changjae Lee, Hervé Hugonnet, Dong Ki Yoon, Shin‐Hyun Kim, Joonwoo Jeong, YongKeun Park
Topics & Concepts
DielectricMaterials scienceOptoelectronicsOpticsPhysicsDigital Holography and MicroscopyElectrical and Bioimpedance TomographyAdvanced X-ray Imaging Techniques