Quantum Confinement and Thickness‐Dependent Electron Transport in Solution‐Processed In<sub>2</sub>O<sub>3</sub> Transistors
Ivan Isakov, Hendrik Faber, Alexander D. Mottram, Satyajit Das, Max Grell, Anna Regoutz, Rebecca Kilmurray, Martyn A. McLachlan, David J. Payne, Thomas D. Anthopoulos
Abstract
Abstract The dependence of charge carrier mobility on semiconductor channel thickness in field‐effect transistors is a universal phenomenon that has been studied extensively for various families of materials. Surprisingly, analogous studies involving metal oxide semiconductors are relatively scarce. Here, spray‐deposited In 2 O 3 layers are employed as the model semiconductor system to study the impact of layer thickness on quantum confinement and electron transport along the transistor channel. The results reveal an exponential increase of the in‐plane electron mobility ( µ e ) with increasing In 2 O 3 thickness up to ≈10 nm, beyond which it plateaus at a maximum value of ≈35 cm 2 V −1 s −1 . Optical spectroscopy measurements performed on In 2 O 3 layers reveal the emergence of quantum confinement for thickness <10 nm, which coincides with the thickness that µ e starts deteriorating. By combining two‐ and four‐probe field‐effect mobility measurements with high‐resolution atomic force microscopy, it is shown that the reduction in µ e is attributed primarily to surface scattering. The study provides important guidelines for the design of next generation metal oxide thin‐film transistors.