Litcius/Paper detail

Crystallization of optically thick films of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:msub><mml:mi>Co</mml:mi><mml:mi>x</mml:mi></mml:msub><mml:msub><mml:mi>Fe</mml:mi><mml:mrow><mml:mn>80</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub><mml:msub><mml:mi mathvariant="normal">B</mml:mi><mml:mn>20</mml:mn></mml:msub></mml:mrow></mml:math>: Evolution of optical, magneto-optical, and structural properties

Apoorva Sharma, Maria A. Hoffmann, Patrick Matthes, Olav Hellwig, Cornelia Kowol, Stefan E. Schulz, Dietrich R. T. Zahn, Georgeta Salvan

2020Physical review. B./Physical review. B15 citationsDOI

Abstract

CoFeB alloys are highly relevant materials for spintronic applications. In this work, the crystallization of CoFeB alloys triggered by thermal annealing was investigated by x-ray diffraction techniques and scanning electron microscopy, as well as spectroscopic ellipsometry and magneto-optical Kerr effect spectroscopy for annealing temperatures ranging from 300 to ${600}^{\ensuremath{\circ}}\mathrm{C}$. The transformation of \ensuremath{\sim}100-nm-thick ${\mathrm{Co}}_{x}{\mathrm{Fe}}_{(80\ensuremath{-}x)}{\mathrm{B}}_{20}$ films from amorphous to polycrystalline was revealed by the sharpening of spectral features observed in optical and magneto-optical dielectric functions spectra. The influence of B on the dielectric function was assessed both experimentally and by optical modeling. By analyzing the Drude component of the optical dielectric function, a consistent trend between the charge-carrier scattering time/resistivity and the annealing temperature was observed, in agreement with the electrical investigations by means of the four-point-probe method.

Topics & Concepts

Materials scienceCrystallizationAnnealing (glass)DielectricAnalytical Chemistry (journal)Amorphous solidSpectroscopyCondensed matter physicsScatteringCrystallographyOpticsPhysicsOptoelectronicsThermodynamicsChemistryQuantum mechanicsComposite materialChromatographyMagnetic properties of thin filmsCopper Interconnects and ReliabilitySemiconductor materials and interfaces