Sequential degradation-based burn-in test with multiple periodic inspections
Jiawen Hu, Qiuzhuang Sun, Zhi‐Sheng Ye, Xiaoliang Ling
Topics & Concepts
Burn-inComputer scienceProduct (mathematics)Reliability engineeringDegradation (telecommunications)Epoch (astronomy)Process (computing)AlgorithmEngineeringMathematicsGeometryComputer visionOperating systemStarsTelecommunicationsReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsSoftware Reliability and Analysis Research