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Characterization of thin films Al/p-Cu2ZnSnS4 (CZTS)/Mo Schottky diode: the effect of CZTS thin film thickness

G. Bousselmi, A. Hannachi, N. Khémiri, M. Kanzari

2023Journal of Materials Science Materials in Electronics11 citationsDOI

Topics & Concepts

CZTSSchottky diodeMaterials scienceEquivalent series resistanceSaturation currentRaman spectroscopyThin filmScanning electron microscopeSchottky barrierOptoelectronicsDiodeAnalytical Chemistry (journal)OpticsComposite materialChemistryNanotechnologyElectrical engineeringChromatographyEngineeringVoltagePhysicsChalcogenide Semiconductor Thin FilmsSemiconductor materials and interfacesQuantum Dots Synthesis And Properties
Characterization of thin films Al/p-Cu2ZnSnS4 (CZTS)/Mo Schottky diode: the effect of CZTS thin film thickness | Litcius