Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient
Sami Salamin, Victor M. van Santen, Martin Rapp, Jörg Henkel, Hussam Amrouch
Abstract
Self-Heating Effects (SHE) is known as one of the key reliability challenges in FinFET and beyond. Large timing guard bands are necessary, which we try to reduce. In this work, we propose operating (biasing) processors at Zero-Temperature Coefficient (ZTC) to contain (mitigate) SHE-induced delay. Operating at ZTC allows near-zero timing guard band to protect circuits against SHE. However, a trade-off is found between thermal timing guard band and performance loss from lowering the voltage.
Topics & Concepts
Guard (computer science)BiasingTransistorVoltageComputer scienceReliability (semiconductor)Electronic circuitTemperature coefficientMaterials scienceOptoelectronicsElectrical engineeringPhysicsEngineeringPower (physics)Programming languageQuantum mechanicsSemiconductor materials and devicesLow-power high-performance VLSI designAdvancements in Semiconductor Devices and Circuit Design