Heavy ion-induced MCUs in 28 nm SRAM-based FPGAs: upset proportions, classifications, and pattern shapes
Shuai Gao, Xinyu Li, Shiwei Zhao, Z. T. He, Bing Ye, Cai Li, You-Mei Sun, Guoqing Xiao, Chang Cai, Jie Liu
Topics & Concepts
Field-programmable gate arrayStatic random-access memoryMicrocontrollerUpsetHeavy ionIrradiationComputer scienceReliability (semiconductor)IonMaterials scienceEmbedded systemPhysicsComputer hardwareEngineeringNuclear physicsPower (physics)Mechanical engineeringQuantum mechanicsRadiation Effects in ElectronicsPhysical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure Analysis