A dual-scale stochastic analysis framework for creep failure considering microstructural randomness
Weichen Kong, Yanwei Dai, Xiang Zhang, Yinghua Liu
Topics & Concepts
Materials scienceRandomnessCreepScale (ratio)Dual (grammatical number)Statistical physicsComposite materialMathematicsStatisticsArtQuantum mechanicsPhysicsLiteratureFatigue and fracture mechanicsProbabilistic and Robust Engineering DesignHigh Temperature Alloys and Creep