Remaining useful life estimation with multiple local similarities
Jianhua Lyu, Rongrong Ying, Ningyun Lu, Baili Zhang
Topics & Concepts
PrognosticsComputer scienceSimilarity (geometry)Reliability (semiconductor)False positive paradoxData miningSet (abstract data type)EstimationEvent (particle physics)Contrast (vision)Unexpected eventsReliability engineeringArtificial intelligenceProgramming languageEconomicsManagementImage (mathematics)Power (physics)EngineeringPhysicsQuantum mechanicsMachine Fault Diagnosis TechniquesReliability and Maintenance OptimizationPower System Reliability and Maintenance