Importance of uniformity of grain size to reduce dc degradation and improve reliability of ultra-thin BaTiO3-based MLCCs
Kunlun Jiang, Lei Zhang, Bo Li, Peng Li, Shuhui Yu, Rong Sun, Zhenxiao Fu, Xiuhua Cao
Topics & Concepts
Materials scienceGrain sizeCeramic capacitorDielectricDopingReliability (semiconductor)DC biasComposite materialCapacitorOptoelectronicsVoltageElectrical engineeringEngineeringQuantum mechanicsPhysicsPower (physics)Ferroelectric and Piezoelectric MaterialsMicrowave Dielectric Ceramics SynthesisDielectric properties of ceramics