Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid
James Famelton, Gareth M. Hughes, C.A. Williams, C. Barbatti, Michael P. Moody, Paul A.J. Bagot
Topics & Concepts
Atom probeMaterials scienceElectropolishingAlloyPlasmaIonXenonAluminiumAtom (system on chip)Analytical Chemistry (journal)MetallurgyAtomic physicsPhysical chemistryNuclear physicsChemistryOrganic chemistryComputer scienceEmbedded systemPhysicsChromatographyElectrolyteElectrodeAdvanced Materials Characterization TechniquesMicrostructure and mechanical propertiesMetal and Thin Film Mechanics