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PMENet: phase map enhancement for Fourier transform profilometry using deep learning

Vignesh Suresh, Yi Zheng, Beiwen Li

2021Measurement Science and Technology22 citationsDOI

Abstract

Abstract Fringe projection profilometry (FPP) is a three-dimensional (3D) shape measurement method that involves projecting fringe patterns onto the object. A phase map retrieved from these fringe images is used for reconstructing the 3D surface of the object. Fourier transform and phase-shifting are two of the widely used fringe analysis techniques for performing 3D shape measurement using FPP. Fourier transform profilometry (FTP) has the advantage of performing high-speed measurement due to its single-shot nature. However, the reconstructed 3D surface has artifacts and high noise, specifically on the edges. On the other hand, phase-shifting profilometry (PSP) has the advantage of higher accuracy (relatively less noise level) but compromises on measurement speed. In this research, we propose a deep learning method to enhance the quality of the FTP phase maps using an efficient deep learning model called phase map enhancement net (PMENet). PMENet takes an FTP phase map as input and predicts a high-quality phase map in a supervised manner by using the phase maps obtained from 18-step PSP as ground truth. The training dataset was generated using a virtual FPP system. Validations were conducted on both the simulated data (generated by virtual FPP system) and the real-world data. The experimental results demonstrate that the trained neural network model can successfully improve the quality of the 3D geometric reconstruction with FTP and reduced the mean and root-mean-square error by 66% and 43%, respectively.

Topics & Concepts

ProfilometerStructured-light 3D scannerComputer scienceArtificial intelligenceFourier transformPhase (matter)Noise (video)Short-time Fourier transformComputer visionPhase retrievalImage (mathematics)MathematicsFourier analysisMaterials scienceSurface finishPhysicsMathematical analysisComposite materialQuantum mechanicsScannerOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesImage Processing Techniques and Applications
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