Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices

Wendong Wang, Ujjwal Guin, Adit D. Singh

2020Journal of Electronic Testing15 citationsDOI

Topics & Concepts

Static random-access memoryRandom number generationCryptographic nonceRandomnessComputer scienceEntropy (arrow of time)EngineeringAlgorithmComputer hardwareMathematicsComputer networkEncryptionPhysicsStatisticsQuantum mechanicsPhysical Unclonable Functions (PUFs) and Hardware SecurityVLSI and Analog Circuit TestingAdvanced Memory and Neural Computing