Multi-level Metric Learning for Few-Shot Image Recognition
Haoxing Chen, Huaxiong Li, Yaohui Li, Chunlin Chen
Topics & Concepts
Computer scienceDiscriminative modelEmbeddingArtificial intelligencePattern recognition (psychology)Feature (linguistics)Metric (unit)PixelSimilarity (geometry)Feature vectorGraphImage (mathematics)Theoretical computer sciencePhilosophyOperations managementLinguisticsEconomicsDomain Adaptation and Few-Shot LearningMultimodal Machine Learning ApplicationsAdvanced Neural Network Applications