Modeling the varying effects of shocks for a multi-stage degradation process
Jia Wang, Xu Han, Yun-an Zhang, Guanghan Bai
Topics & Concepts
Degradation (telecommunications)Reliability (semiconductor)Shock (circulatory)AccelerationReliability engineeringStage (stratigraphy)Failure rateProcess (computing)Computer scienceEngineeringPhysicsThermodynamicsClassical mechanicsMedicineBiologyTelecommunicationsPaleontologyOperating systemPower (physics)Internal medicineReliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research