Radiation Emission Source Localization by Magnetic Near-Field Mapping Along the Surface of a Large-Scale IC With BGA Package
Quan Huang, Rongquan Chen, Wenxiao Fang, Xin Liu, Xinxin Tian, Weiheng Shao, Lei Wang, Chen Sun, Zhiqiang Yi, Yunfei En, Guoguang Lu, Zeyi Li, Yan Gao
Abstract
Near-field mapping along the surface of an integrated circuit (IC) could reveal the radiated emission source inside by collecting the radiated electromagnetic field. In this article, the radiated emission source localization is first illustrated in a microstrip line model by analyzing the relationship between the physical position of the line and the hot spots of the electromagnetic field distribution along the line surface. The hot spot in each magnetic field distribution does not necessarily correspond to the physical position of the emission source due to the ground plane below. Furthermore, by analogy with the microstrip line model, the localization analysis is applied to a large-scale IC [field-programmable gate array (FPGA)] in a ball grid array package. For the demonstration, four operation states of the FPGA are designed with four general-purpose input–output (GPIO) pins outputting waveforms of different frequencies. By activating the sources in different operation states, it is found that the activated GPIO pins (as emission sources) can be located well by comprehensively analyzing the emission patterns of different components. The experimental results would be instructive to improve the understanding of IC near-field electromagnetic patterns and reasonable to localize an emission source.