Quantitative nanoscale tracking of oxygen vacancy diffusion inside single ceria grains by in situ transmission electron microscopy
Yong Ding, YongMan Choi, Yu Chen, Ken C. Pradel, Meilin Liu, Zhong Lin Wang
Topics & Concepts
Materials scienceVacancy defectScanning transmission electron microscopyGrain boundaryTransmission electron microscopyDiffusionHigh-resolution transmission electron microscopyOxygenChemical physicsAnalytical Chemistry (journal)CrystallographyMicrostructureNanotechnologyChemistryMetallurgyThermodynamicsOrganic chemistryChromatographyPhysicsCatalytic Processes in Materials ScienceAdvancements in Solid Oxide Fuel CellsElectronic and Structural Properties of Oxides