Temperature sensitivity analysis of dual material stack gate oxide source dielectric pocket TFET
Kaushal Nigam, Satyendra Kumar, Dharmender Dharmender
Topics & Concepts
TransconductanceIntermodulationMaterials scienceLinearityOptoelectronicsTransistorTunnel field-effect transistorRadio frequencyStack (abstract data type)Sensitivity (control systems)DielectricElectrical engineeringField-effect transistorVoltageElectronic engineeringComputer scienceAmplifierEngineeringCMOSProgramming languageAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesNanowire Synthesis and Applications