Dual-Components Magnetic Probe for Electromagnetic Interference Measurement
Ze-Kai Hu, Xing‐Chang Wei
Abstract
In this paper, a dual-components magnetic probe which can measure the magnetic fields <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$H_{x}$</tex> and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$H_{y}$</tex> at the same time is proposed. The dual-components probe saves lots of scanning time when one need to measure both <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$H_{x}$</tex> and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$H_{y}$</tex> in electromagnetic interference measurement. Its working frequency ranges from 20MHz to 6GHz. The probe is designed based on a four-layered printed circuit board. The simulation and measurement results show that the sensitivity of the fabricated probe is high, and even higher than the commercial single component magnetic probe.