Multi-source-data-driven microgrids reliability analysis via power supply chain using deep learning
Yulu Zhang, Zhiwei Chen, Xinghui Dong, Hongyan Dui, Min-Kuan Chang, Junqiang Bai
Topics & Concepts
Reliability (semiconductor)Supply chainReliability engineeringComputer sciencePower (physics)Artificial intelligenceData miningEngineeringBusinessPhysicsQuantum mechanicsMarketingPower System Reliability and MaintenanceElectricity Theft Detection TechniquesSmart Grid Security and Resilience