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Detailed Modeling and In-Situ Calorimetric Verification of Three-Phase Sparse NPC Converter Power Semiconductor Losses

Daifei Zhang, Davide Cittanti, Pengpeng Sun, Jonas Huber, Radu Bojoi, Johann W. Kolar

2023IEEE Journal of Emerging and Selected Topics in Power Electronics16 citationsDOI

Abstract

The three-phase (3- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\Phi $ </tex-math></inline-formula> ) three-level (3-L) sparse neutral point clamped converter (SNPCC) combines a 3-L matrix stage and a 3- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\Phi $ </tex-math></inline-formula> two-level (2-L) inverter stage to generate 3-L switched output voltages with a reduced transistor count (10 instead of 12 or 18) compared with the classical 3-L NPCC or 3-L active NPCC structure, targeting variable-speed drive (VSD) systems with low ripple of the motor phase currents or bidirectional 3- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\Phi $ </tex-math></inline-formula> power factor correcting (PFC) rectifier systems with reduced boost inductor volume. This article analyzes and experimentally characterizes the performance of an IGBT-based 3- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\Phi 3$ </tex-math></inline-formula> -L SNPCC and describes, for the first time, a hybrid current commutation effect between inverter-stage diodes and matrix-stage IGBTs that occurs when operating with lower modulation indices and leads to increased switching losses (up to <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${20}{\%}$ </tex-math></inline-formula> ). The proposed new semiconductor loss modeling approach accounts for this effect successfully, which is verified ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$&lt; {10}{\%}$ </tex-math></inline-formula> error) on an 800- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${\text {V}}_{\text {dc}}$ </tex-math></inline-formula> , 7.5-kW SNPCC hardware demonstrator using a new in-situ calorimetric method that facilitates accurate stage-level semiconductor loss measurements. Heat spreading effects caused by the asymmetrical losses injection and thermal decoupling between two in-situ loss measurement blocks are carefully checked with finite-element method (FEM) simulations. Furthermore, an experimental evaluation of common-mode (CM) and differential-mode (DM) high-frequency (HF) voltage-time area ripples (as a generic measure for the required filtering effort) for three typical symmetrical and asymmetrical modulation switching state sequences is provided together with the semiconductor loss characterization. Utilizing a low-switching-loss asymmetric modulation scheme that operates the 3-L matrix stage and the 2-L inverter stage with the effective switching frequencies of 16 kHz and 5.3 kHz, respectively, the 3-L SNPCC demonstrator finally achieves a high rated power (7.5 kW, load current phase shift <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\phi = 0$ </tex-math></inline-formula> ) semiconductor efficiency of 98.8%.

Topics & Concepts

InverterNotationInsulated-gate bipolar transistorPower (physics)DiodeAlgorithmMathematicsTopology (electrical circuits)Computer sciencePhysicsCombinatoricsQuantum mechanicsArithmeticMultilevel Inverters and ConvertersAdvanced DC-DC ConvertersSilicon Carbide Semiconductor Technologies
Detailed Modeling and In-Situ Calorimetric Verification of Three-Phase Sparse NPC Converter Power Semiconductor Losses | Litcius