Identification of wheat leaf diseases and their severity based on elliptical-maximum margin criterion metric learning
Wenxia Bao, Jian Zhao, Gensheng Hu, Dongyan Zhang, Linsheng Huang, Dong Liang
Topics & Concepts
Powdery mildewMetric (unit)Pattern recognition (psychology)Identification (biology)Computer scienceFeature vectorArtificial intelligenceRust (programming language)Transformation (genetics)Margin (machine learning)AlgorithmMathematicsMachine learningAgronomyBiologyBotanyProgramming languageBiochemistryGeneOperations managementEconomicsSmart Agriculture and AILeaf Properties and Growth MeasurementSpectroscopy and Chemometric Analyses