A new ViT-Based augmentation framework for wafer map defect classification to enhance the resilience of semiconductor supply chains
Shu‐Kai S. Fan, Shang-Hao Chiu
Topics & Concepts
WaferComputer scienceArtificial intelligenceSemiconductor device fabricationSupply chainPattern recognition (psychology)Reliability engineeringMaterials scienceEngineeringNanotechnologyBusinessMarketingIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques