Reliability of AI-generated magnetograms from only EUV images
Jiajia Liu, Yimin Wang, Xin Huang, M. B. Korsós, Ye Jiang, Yuming Wang, R. Erdélyi
Topics & Concepts
Reliability (semiconductor)Extreme ultraviolet lithographyArtificial intelligenceRemote sensingComputer scienceComputer visionPhysicsOpticsGeologyPower (physics)Quantum mechanicsSolar and Space Plasma DynamicsGeomagnetism and Paleomagnetism StudiesInertial Sensor and Navigation