Atomic force microscopy and ellipsometry investigations of rare earth oxide Dy2O3 nano-layer processed by electron beam evaporation on n-GaAs substrate
W. Ouerghui, H. Saghrouni, Lotfi Béji
Topics & Concepts
Materials scienceSubstrate (aquarium)Layer (electronics)EvaporationOxideOpticsThin filmOptoelectronicsDysprosiumElectron beam physical vapor depositionEllipsometryNanotechnologyChemistryPhysicsInorganic chemistryOceanographyGeologyThermodynamicsMetallurgySemiconductor materials and devicesDiamond and Carbon-based Materials ResearchForce Microscopy Techniques and Applications