Design of MNU-Resilient latches based on input-split C-elements
Zhengfeng Huang, Xiandong Li, Zhouyu Gong, Huaguo Liang, Yingchun Lu, Yiming Ouyang, Tianming Ni
Topics & Concepts
UpsetNode (physics)Resilience (materials science)InterconnectionOverhead (engineering)Single event upsetComputer scienceReliability (semiconductor)Electronic engineeringPower (physics)EngineeringStatic random-access memoryElectrical engineeringPhysicsTelecommunicationsStructural engineeringMechanical engineeringQuantum mechanicsThermodynamicsRadiation Effects in ElectronicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit Design