Selective hardening of RISCV soft-processors for space applications
Giorgio Cora, Corrado De Sio, S. Azimi, L. Sterpone
Abstract
RISC-V soft processors are becoming popular in various fields, including safety-critical ones, thanks to their open-source nature and flexibility. Despite the rapid progress in the reliability analysis of these devices, all the mitigation techniques are usually adopted to the whole soft-processor architecture. In this study, we aim to identify the internal components of the RISC-V architecture that are particularly prone to errors, and accordingly investigate how the reliability of the design is affected when mitigation strategies, such as Triple Modular Redundancy (TMR), are applied selectively just to them. The proposed approach has been applied to RISC-V architecture, NEORV32 which is implemented on Zynq 7020 SoC on a PYNQ-Z2 board. While more vulnerable modules of NEORV32 were identified through accurate reliability analysis, implementing selective TMR in these modules shows achieving satisfactory reliability levels while reducing the overall space requirements compared to a complete TMR design. • RISC-V Architectures gained a lot of interest in Safety Critical applications. • RISC-V Modularity has been exploited to improve reliability. • A new Reliability analysis flow has been developed. • Reliability against SEUS and MBU have been analysed.