State-of-the-art active optical techniques for three-dimensional surface metrology: a review [Invited]
Andrés G. Marrugo, Feng Gao, Song Zhang
Abstract
This paper reviews recent developments of non-contact three-dimensional (3D) surface metrology using an active structured optical probe. We focus primarily on those active non-contact 3D surface measurement techniques that could be applicable to the manufacturing industry. We discuss principles of each technology, and its advantageous characteristics as well as limitations. Towards the end, we discuss our perspectives on the current technological challenges in designing and implementing these methods in practical applications.
Topics & Concepts
MetrologyFocus (optics)Surface metrologyNanotechnologyCurrent (fluid)Surface (topology)Computer scienceEngineeringSystems engineeringMechanical engineeringMaterials scienceOpticsPhysicsElectrical engineeringProfilometerSurface finishMathematicsGeometrySurface Roughness and Optical MeasurementsOptical measurement and interference techniquesAdvanced Measurement and Metrology Techniques