Rapid and Large-Area Visualization of Grain Boundaries in MoS<sub>2</sub> on SiO<sub>2</sub> Using Vapor Hydrofluoric Acid
Xuge Fan, Rita Siris, Oliver Hartwig, Georg S. Duesberg, Frank Niklaus
Abstract
pattern using optical microscopy, scanning electron microscopy, or Raman spectroscopy. This method allows for a simple and rapid evaluation of grain sizes in 2D material films over large areas, thereby potentially facilitating the optimization of synthesis processes and advancing applications of 2D materials in science and technology.
Topics & Concepts
Materials scienceGrain boundaryRaman spectroscopySiliconSubstrate (aquarium)Molybdenum disulfideHydrofluoric acidChemical vapor depositionOptoelectronicsNanotechnologyMicrostructureComposite materialOpticsMetallurgyOceanographyPhysicsGeology2D Materials and ApplicationsMXene and MAX Phase MaterialsGraphene research and applications