Mechanical spectroscopy of materials using atomic force microscopy (AFM-MS)
М. П. Петров, Daniel Canena, Nikita K. Kulachenkov, Naresh Kumar, Pierre Nickmilder, Philippe Leclère, Igor Sokolov
Abstract
Here, we present a novel mechano-spectroscopic atomic force microscopy (AFM-MS) technique that overcomes the limitations of current spectroscopic methods by combining the high-resolution imaging capabilities of AFM with machine learning (ML) classification. AFM-MS employs AFM operating in sub-resonance tapping imaging mode, which enables the collection of multiple physical and mechanical property maps of a sample with sub-nanometer lateral resolution in a highly repeatable manner. By comparing these properties to a database of known materials, the technique identifies the location of constituent materials at each image pixel with the assistance of ML algorithms. We demonstrate AFM-MS on various material mixtures, achieving an unprecedented lateral spectroscopic resolution of 1.6 nm. This powerful approach opens new avenues for nanoscale material study, including the material identification and correlation of nanostructure with macroscopic material properties. The ability to map material composition with such high resolution will significantly advance the understanding and design of complex, nanostructured materials.