Remaining useful life prediction considering correlated multi-parameter nonlinear degradation and small sample conditions
Cheng Qian, Yuhang Li, Yao Zhu, Dezhen Yang, Yi Ren, Quan Xia, Zili Wang
Topics & Concepts
Copula (linguistics)Nonlinear systemConsistency (knowledge bases)Degradation (telecommunications)Computer scienceMathematicsEngineeringSample (material)Generator (circuit theory)Wiener processSample size determinationFunction (biology)Mathematical optimizationProcess (computing)AlgorithmData miningReliability engineeringStatisticsParametric statisticsCorrelationReliability and Maintenance OptimizationAdvanced Battery Technologies ResearchStructural Health Monitoring Techniques