A soft-error resilient low power static random access memory cell
Ashish Sachdeva, V. K. Tomar
Topics & Concepts
InterleavingStatic random-access memoryComputer scienceNoise marginSoft errorNode (physics)Access timePower (physics)Random accessComputer hardwareElectronic engineeringTransistorElectrical engineeringVoltagePhysicsEngineeringComputer networkQuantum mechanicsOperating systemLow-power high-performance VLSI designRadiation Effects in ElectronicsAdvanced Memory and Neural Computing