Terahertz phase retrieval imaging in reflection
Nikolay V. Petrov, Jean-Baptiste Perraud, Adrien Chopard, Jean-Paul Guillet, O. A. Smolyanskaya, Patrick Mounaix
Abstract
Terahertz phase retrieval is a promising technique able to assess the complex diffracted wave properties through an iterative processing algorithm. In this Letter, we demonstrate the implementation of this technique in reflection geometry with a continuous wave acquisition system working at 0.287 THz. To ensure a high signal-to-noise ratio in the measured dataset, we proposed a double parallel recording scheme with one detector and two lock-in amplifiers operating with the complimentary sensitivity setting. This provided a higher numerical aperture than conventional raster-scanning focal plane imaging. A specialized digital interferometric postprocessing procedure was applied to obtain a surface height map from the reconstructed phase distribution in the object's irradiated area.