Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method
Reza Shakoury, Sahar Rezaee, Fredrick Madaraka Mwema, Carlos Luna, Koushik Ghosh, Stanislav Jurečka, Ştefan Ţălu, Ali Arman, Alireza Grayeli Korpi
Topics & Concepts
Materials scienceThin filmBand gapAnalytical Chemistry (journal)EllipsometryRefractive indexTantalum pentoxideMultifractal systemTransmittanceOpticsOptoelectronicsNanotechnologyFractalChemistryPhysicsMathematical analysisMathematicsChromatographySurface Roughness and Optical MeasurementsCultural Heritage Materials AnalysisThin-Film Transistor Technologies